Keynote Speaker
Juin J. Liou

Juin J. Liou

Chair Professor, School of Electrical and Information Engineering, North Minzu University, China
Chang Jiang Scholar Endowed Professor, Ministry of Education, China
Fellow of IEEE, Fellow of IET, Fellow of AAIA

Speech Title: Electrostatic Discharge (ESD) Protection in Silicon FinFET Technology and Beyond: Status and Challenges

Abstract: Electrostatic discharge (ESD) is one of the most prevalent threats to the reliability of electronic components. It is an event in which a finite amount of charge is transferred from one object (i.e., human body) to the other (i.e., microchip). This process can result in a very high current passing through the microchip within a very short period of time, and hence more than 35% of single-event catastrophic damages can be attributed to the ESD event. This is a problem with increasing significance in modern and future nanoscale technologies in the context of diminishing device dimensions. As such, designing on-chip ESD structures to protect integrated circuits against the ESD stress is a high priority in the semiconductor industry. The continuing advancement in semiconductor technology makes the ESD-induced failures even more prominent. In fact, many semiconductor companies worldwide are having difficulties in meeting the increasingly stringent ESD protection requirements for various tech applications, and one can predict with certainty that the availability of effective and robust ESD protection solutions will become a critical and essential factor to the well-being and commercialization of next-generation electronics.
An overview on the ESD sources, models, protection schemes, and testing will first be given in this talk. This is followed by the introduction of ESD protection designs in the advanced silicon FinFET process, and then the exploration and evaluation of ESD protection solutions in the emerging silicon nanowire technology. Status, challenges, and difficulties associated with the ESD design and optimization for these technologies will be addressed.

Biography: Juin J. Liou received the B.S. (honors), M.S., and Ph.D. degrees in electrical engineering from the University of Florida, Gainesville, in 1982, 1983, and 1987, respectively. In 1987, he joined the Department of Electrical and Computer Engineering at the University of Central Florida (UCF), Orlando, Florida where he held the positions of Pegasus Distinguished Professor, Lockheed Martin St. Laurent Professor, and UCF-Analog Devices Fellow. Dr. Liou is currently a chair professor at North Minzu University, China. Dr. Liou’s research interests are electrostatic discharge (ESD) protection design, modeling and simulation, and characterization.
Dr. Liou holds 25 patents and has published 13 books, more than 360 journal papers (including 22 invited review articles), and more than 265 papers (including more than 120 keynote and invited papers) in international and national conference proceedings. Dr. Liou has served as a technical reviewer for various journals and publishers, general chair or technical program chair for a large number of international conferences, regional editor (in USA, Canada and South America) of the Microelectronics Reliability journal, and guest editor of 7 special issues in the IEEE Journal of Emerging and Selected Topics in Circuits and Systems, Microelectronics Reliability, Solid-State Electronics, World Scientific Journal, and International Journal of Antennas and Propagation.
Dr. Liou received ten different awards on excellence in teaching and research from the University of Central Florida (UCF) and six different awards from the IEEE. Among them, he was awarded the UCF Pegasus Distinguished Professor (2009) – the highest honor bestowed to a faculty member at UCF, UCF Distinguished Researcher Award (four times: 1992, 1998, 2002,, UCF Research Incentive Award (four times: 2000, 2005, 2010, 2015), IEEE Joseph M. Biedenbach Outstanding Engineering Educator Award in 2004 for exemplary engineering teaching, research, and international collaboration, and IEEE Electron Devices Society Education Award in 2014 for promoting and inspiring global education and learning in the field of electron devices. His other honors are Fellow of IEEE, Fellow of IET, Fellow of AAIA, Fellow of Singapore Institute of Manufacturing Technology, Fellow of UCF-Analog Devices, Distinguished Lecturer of IEEE Electron Device Society (EDS), and Distinguished Lecturer of National Science Council. He holds several honorary professorships, including the Chang Jiang Scholar Endowed Professor of Ministry of Education, China – the highest honorary professorship in China.
Dr. Liou had served as the IEEE EDS Vice-President of Regions/Chapters, IEEE EDS Treasurer, IEEE EDS Finance Committee Chair, Member of IEEE EDS Board of Governors, and Member of IEEE EDS Educational Activities Committee.